Description / Abstract:
This document is an annex to EIA Engineering Bulletin SSB-1,
Guidelines for Using Plastic Encapsulated Microcircuits and
Semiconductors in Military, Aerospace and Other Rugged
Applications (the latest revision).
This document provides reference information concerning
acceleration factors commonly used by device manufacturers to model
failure rates in conjunction with statistical reliability
monitoring. These acceleration factors are frequently used by OEMs
in conjunction with physics of failure reliability analysis to
assess the suitability of plastic encapsulated microcircuits and
semiconductors for specific end use applications.